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The Vanta Element handheld X-Ray Fluorescence (XRF) analyzer provides elemental analysis for alloy grade ID. Rugged and suitable for demanding PMI applications. Data exportable via USB.
DC Porosity (Holiday) detector. Detects pinholes in coatings above 150um on metal substrates such as pipes and tanks. 0-30kV, 3.5 digit L..
Comprises an LCD display and a detachable detector/drive unit. Parameters measured in Ra, Rq, Ry, Rz, Rt, Rp, R3z, Rk, Rpk, Rvk, S, Sm, Pc,..
Defelsco PosiTector 200 Advanced ultrasonic coating thickness gauge with type B & C Probes. Measures coating thicknes over wood, concre..
Measures the force required to pull a specified test diameter of coating away from its substrate using hydraulic pressure. Pressure is di..
Tags: Olympus Vanta Element, handheld X-ray fluorescence, XRF analyzer, elemental analysis